| 000 -LEADER |
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| fixed length control field |
a |
| 003 - CONTROL NUMBER IDENTIFIER |
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| control field |
OSt |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
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| control field |
20200115121301.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
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| fixed length control field |
200115b xxu||||| |||| 00| 0 eng d |
| 040 ## - CATALOGING SOURCE |
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| Original cataloging agency |
AIKTC-KRRC |
| Transcribing agency |
AIKTC-KRRC |
| 100 ## - MAIN ENTRY--PERSONAL NAME |
|---|
| 9 (RLIN) |
11723 |
| Author |
Bhatta, Umananda M. |
| 245 ## - TITLE STATEMENT |
|---|
| Title |
Fabrication and characterization of thermally oxidized TiO2thin films on Si(100) substrates |
| 250 ## - EDITION STATEMENT |
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| Volume, Issue number |
Vol.57(10), Oct |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
|---|
| Place of publication, distribution, etc. |
New Delhi |
| Name of publisher, distributor, etc. |
CSIR |
| Year |
2019 |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Pagination |
732-736p. |
| 520 ## - SUMMARY, ETC. |
|---|
| Summary, etc. |
Mixed phase TiO2is known to have better photocatalytic property as the resulting grain boundaries and interfaces between substrate, anatase and rutile phases play a crucial role in transferring/trapping photogenerated electrons. Here we have grown three different thicknesses (10 nm, 30 nm and 50 nm) of Ti thin films on Si(100) substrate in a sputter coater. Thermal oxidation in air at 600 °C for 1 h leads to the formation of mixed phase TiO2thin films. Surface morphology and crystalline quality of thin film are discussed using XRD, SEM and TEM results. Moiré fringes resulting from interfacial strain have been discussed using lattice resolved HRTEM images. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| 9 (RLIN) |
4642 |
| Topical term or geographic name entry element |
Humanities and Applied Science |
| 700 ## - ADDED ENTRY--PERSONAL NAME |
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| 9 (RLIN) |
11724 |
| Co-Author |
Guha, Puspendu |
| 773 0# - HOST ITEM ENTRY |
|---|
| Place, publisher, and date of publication |
New Delhi CSIR-NISCAIR |
| International Standard Serial Number |
0019-5596 |
| Title |
Indian journal of pure & applied physics (IJPAP) |
| 856 ## - ELECTRONIC LOCATION AND ACCESS |
|---|
| URL |
http://nopr.niscair.res.in/bitstream/123456789/51113/1/IJPAP%2057%2810%29%20732-736.pdf |
| Link text |
Click here |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
|---|
| Source of classification or shelving scheme |
|
| Koha item type |
Articles Abstract Database |
