Anomalous critical field dependence of Cr-Nb-Cr trilayers on niobium thickness (Record no. 17827)
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000 -LEADER | |
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fixed length control field | a |
003 - CONTROL NUMBER IDENTIFIER | |
control field | OSt |
005 - DATE AND TIME OF LATEST TRANSACTION | |
control field | 20221021100846.0 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 221021b xxu||||| |||| 00| 0 eng d |
040 ## - CATALOGING SOURCE | |
Original cataloging agency | AIKTC-KRRC |
Transcribing agency | AIKTC-KRRC |
100 ## - MAIN ENTRY--PERSONAL NAME | |
9 (RLIN) | 18430 |
Author | Vaidhyanathan, L. S. |
245 ## - TITLE STATEMENT | |
Title | Anomalous critical field dependence of Cr-Nb-Cr trilayers on niobium thickness |
250 ## - EDITION STATEMENT | |
Volume, Issue number | Vol.60(3), Mar |
260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
Place of publication, distribution, etc. | New Delhi |
Name of publisher, distributor, etc. | CSIR |
Year | 2022 |
300 ## - PHYSICAL DESCRIPTION | |
Pagination | 198-203p. |
520 ## - SUMMARY, ETC. | |
Summary, etc. | Cr-Nb-Cr trilayer thin films were deposited using DC/RF sputtering with Cr layer thickness maintained at 7.5 nm and Nb thickness varying from 30 nm to 229 nm, in order to study the interplay of antiferromagnetism and superconductivity. Various viewpoints have been expressed in the literature with respect to analyzing the anomalous properties that have been identified in superconductor/magnetic thin films. The study of Cr-Nb-Cr thin films were taken up to identify the existence of similar anomalous superconducting properties on account of antiferromagnetic-superconductor interfaces. X-ray reflectivity measurements showed high quality of thin film structure with minimum surface and interface roughness. Transport measurements down to 2K were carried out in the presence of magnetic fields up to 2 T applied perpendicular to the trilayers to deduce Tc. The suppression of Tc due to Cr layer is larger than proximity effect of similar metal films. It could be explained by proximity effect using antiferromagnetic Cr layer. Upper critical field measurements show a distinct non monotonic dependence of upper critical magnetic field and the slope on Nb layer thickness. The analysis due to WHH theory to deduce upper critical fields for the trilayer thin films studied did not match with experimental values. Although studies performed on Cr-Nb-Cr trilayers did not show any anomaly in Tc, it clearly showed a depression of Tc much larger than proximity effect, non monotonic behavior in Bc2(0) and dBc 2/dT c behavior with Nb layer thickness. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
9 (RLIN) | 4642 |
Topical term or geographic name entry element | Humanities and Applied Sciences |
700 ## - ADDED ENTRY--PERSONAL NAME | |
9 (RLIN) | 18431 |
Co-Author | Baskaran, R. |
773 0# - HOST ITEM ENTRY | |
Place, publisher, and date of publication | New Delhi CSIR-NISCAIR |
Title | Indian journal of pure & applied physics (IJPAP) |
International Standard Serial Number | 0019-5596 |
856 ## - ELECTRONIC LOCATION AND ACCESS | |
URL | http://nopr.niscpr.res.in/bitstream/123456789/59499/1/IJPAP%2060%283%29%20198-203.pdf |
Link text | Click here |
942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
Source of classification or shelving scheme | |
Koha item type | Articles Abstract Database |
Withdrawn status | Lost status | Source of classification or shelving scheme | Damaged status | Not for loan | Permanent Location | Current Location | Shelving location | Date acquired | Barcode | Date last seen | Price effective from | Koha item type |
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School of Engineering & Technology | School of Engineering & Technology | Archieval Section | 2022-10-21 | 2022-1889 | 2022-10-21 | 2022-10-21 | Articles Abstract Database |