Efficient analysis of defects using naive bayes classification and impact on effort and cost of the project
By: Veni, S
.
Contributor(s): Srinivasan, Aparna.
Publisher: Delhi Research India Publication 2018Edition: Vol. 11(2), July-December.Description: 91-99.Subject(s): EXTC Engineering
In:
Advances in wireless and mobile communications (AWMC)Summary: Research work focuses on impact of defects identified in various stages of software development life cycle (SDLC) on overall project effort and cost. Naive bayes classification technique is used to identify the bug tracking...............
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School of Engineering & Technology Archieval Section | Not for loan | 2018125 |
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Research work focuses on impact of defects identified in various stages of software development life cycle (SDLC) on overall project effort and cost. Naive bayes classification technique is used to identify the bug tracking...............
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