EM Material Characterization Techniques for Metamaterials [electronic resource] /
By: Nair, Raveendranath U [author.].
Contributor(s): Dutta, Maumita [author.] | P.S., Mohammed Yazeen [author.] | Venu, K. S [author.] | SpringerLink (Online service).
Series: SpringerBriefs in Computational Electromagnetics: Publisher: Singapore : Springer Singapore : Imprint: Springer, 2018Edition: 1st ed. 2018.Description: XXIII, 50 p. 18 illus., 12 illus. in color. | Binding - Card Paper |.Content type: text Media type: computer Carrier type: online resourceISBN: 9789811065170.Subject(s): EXTC Engineering
| Microwaves, RF and Optical Engineering | Optical and Electronic Materials | Communications Engineering, NetworksDDC classification: 621.3 Online resources: Click here to access eBook in Springer Nature platform. (Within Campus only.)
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Springer Nature eBookSummary: This book presents a review of techniques based on waveguide systems, striplines, freespace systems and more, discussing the salient features of each method in detail. Since metamaterials are typically inhomogeneous and anisotropic, the experimental techniques for electromagnetic (EM) material characterization of metamaterial structures need to tackle several challenges. Furthermore, the modes supported by metamaterial structures are extremely sensitive to external perturbations. As such the measurement fixtures for EM material characterization have to be modified to account for such effects. The book provides a valuable resource for researchers working in the field of metamaterials .
This book presents a review of techniques based on waveguide systems, striplines, freespace systems and more, discussing the salient features of each method in detail. Since metamaterials are typically inhomogeneous and anisotropic, the experimental techniques for electromagnetic (EM) material characterization of metamaterial structures need to tackle several challenges. Furthermore, the modes supported by metamaterial structures are extremely sensitive to external perturbations. As such the measurement fixtures for EM material characterization have to be modified to account for such effects. The book provides a valuable resource for researchers working in the field of metamaterials .
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