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_c10925 _d10925 |
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005 | 20200115121301.0 | ||
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_aAIKTC-KRRC _cAIKTC-KRRC |
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_911723 _aBhatta, Umananda M. |
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245 | _aFabrication and characterization of thermally oxidized TiO2thin films on Si(100) substrates | ||
250 | _aVol.57(10), Oct | ||
260 |
_aNew Delhi _bCSIR _c2019 |
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300 | _a732-736p. | ||
520 | _aMixed phase TiO2is known to have better photocatalytic property as the resulting grain boundaries and interfaces between substrate, anatase and rutile phases play a crucial role in transferring/trapping photogenerated electrons. Here we have grown three different thicknesses (10 nm, 30 nm and 50 nm) of Ti thin films on Si(100) substrate in a sputter coater. Thermal oxidation in air at 600 °C for 1 h leads to the formation of mixed phase TiO2thin films. Surface morphology and crystalline quality of thin film are discussed using XRD, SEM and TEM results. Moiré fringes resulting from interfacial strain have been discussed using lattice resolved HRTEM images. | ||
650 | 0 |
_94642 _aHumanities and Applied Science |
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700 |
_911724 _aGuha, Puspendu |
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773 | 0 |
_dNew Delhi CSIR-NISCAIR _x0019-5596 _tIndian journal of pure & applied physics (IJPAP) |
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856 |
_uhttp://nopr.niscair.res.in/bitstream/123456789/51113/1/IJPAP%2057%2810%29%20732-736.pdf _yClick here |
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942 |
_2ddc _cAR |