000 03440nam a22004935i 4500
999 _c11874
_d11874
001 978-3-319-47597-4
003 DE-He213
005 20211210160825.0
008 170430s2017 gw | s |||| 0|eng d
020 _a9783319475974
040 _cAIKTC-KRRC
041 _aENG
072 7 _aTJFC
_2bicssc
072 7 _aTEC008010
_2bisacsh
072 7 _aTJFC
_2thema
082 0 4 _a621.3815
_223
100 1 _aJ.M. Veendrick, Harry.
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
245 1 0 _aNanometer CMOS ICs
_h[electronic resource] :
_bFrom Basics to ASICs /
250 _a2nd ed. 2017.
264 1 _aCham :
_bSpringer International Publishing :
_bImprint: Springer,
_c2017.
300 _aXXXVII, 611 p. 445 illus., 271 illus. in color.
_bCard Paper
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
520 _aThis textbook provides a comprehensive, fully-updated introduction to the essentials of nanometer CMOS integrated circuits. It includes aspects of scaling to even beyond 12nm CMOS technologies and designs. It clearly describes the fundamental CMOS operating principles and presents substantial insight into the various aspects of design implementation and application. Coverage includes all associated disciplines of nanometer CMOS ICs, including physics, lithography, technology, design, memories, VLSI, power consumption, variability, reliability and signal integrity, testing, yield, failure analysis, packaging, scaling trends and road blocks. The text is based upon in-house Philips, NXP Semiconductors, Applied Materials, ASML, IMEC, ST-Ericsson, TSMC, etc., courseware, which, to date, has been completed by more than 4500 engineers working in a large variety of related disciplines: architecture, design, test, fabrication process, packaging, failure analysis and software.
650 0 _aMechanical Engineering
_94626
653 _aElectronic Circuits and Devices.
653 _aElectronics and Microelectronics, Instrumentation.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer Nature eBook
776 0 8 _iPrinted edition:
_z9783319475950
776 0 8 _iPrinted edition:
_z9783319475967
776 0 8 _iPrinted edition:
_z9783319837772
856 4 0 _uhttps://doi.org/10.1007/978-3-319-47597-4
_zClick here to access eBook in Springer Nature platform. (Within Campus only.)
942 _cEBOOKS
_2ddc