000			nasaa22 7a 4500
999			_c16600 _d16600
003			OSt
005			20220531123117.0
008			220531b xxu||||| |||| 00| 0 eng d
022			_a0377-2063
040			_cAIKTC-KRRC _dAIKTC-KRRC
245			_aIETE Journal of Research
260			_aNew Delhi _bThe Institution of Electronics and Telecommunication Engineers (IETE)
310			_aBi-Monthly
520			_aIETE and our publisher Taylor & Francis make every effort to ensure the accuracy of all the information (the "Content") contained in our publications. However, IETE and our publisher Taylor & Francis, our agents (including the editor, any member of the editorial team or editorial board, and any guest editors), and our licensors make no representations or warranties whatsoever as to the accuracy, completeness, or suitability for any purpose of the Content. Any opinions and views expressed in this publication are the opinions and views of the authors, and are not the views of or endorsed by IETE and our publisher Taylor & Francis. The accuracy of the Content should not be relied upon and should be independently verified with primary sources of information. IETE and our publisher Taylor & Francis shall not be liable for any losses, actions, claims, proceedings, demands, costs, expenses, damages, and other liabilities whatsoever or howsoever caused arising directly or indirectly in connection with, in relation to, or arising out of the use of the Content. Terms & Conditions of access and use can be found at http://www.tandfonline.com/page/terms-and-conditions .
650		0	_94623 _aElectrical Engineering
942			_2ddc _cP _s1