000			a
999			_c17827 _d17827
003			OSt
005			20221021100846.0
008			221021b xxu||||| |||| 00| 0 eng d
040			_aAIKTC-KRRC _cAIKTC-KRRC
100			_918430 _aVaidhyanathan, L. S.
245			_aAnomalous critical field dependence of Cr-Nb-Cr trilayers on niobium thickness
250			_aVol.60(3), Mar
260			_aNew Delhi _bCSIR _c2022
300			_a198-203p.
520			_aCr-Nb-Cr trilayer thin films were deposited using DC/RF sputtering with Cr layer thickness maintained at 7.5 nm and Nb thickness varying from 30 nm to 229 nm, in order to study the interplay of antiferromagnetism and superconductivity. Various viewpoints have been expressed in the literature with respect to analyzing the anomalous properties that have been identified in superconductor/magnetic thin films. The study of Cr-Nb-Cr thin films were taken up to identify the existence of similar anomalous superconducting properties on account of antiferromagnetic-superconductor interfaces. X-ray reflectivity measurements showed high quality of thin film structure with minimum surface and interface roughness. Transport measurements down to 2K were carried out in the presence of magnetic fields up to 2 T applied perpendicular to the trilayers to deduce Tc. The suppression of Tc due to Cr layer is larger than proximity effect of similar metal films. It could be explained by proximity effect using antiferromagnetic Cr layer. Upper critical field measurements show a distinct non monotonic dependence of upper critical magnetic field and the slope on Nb layer thickness. The analysis due to WHH theory to deduce upper critical fields for the trilayer thin films studied did not match with experimental values. Although studies performed on Cr-Nb-Cr trilayers did not show any anomaly in Tc, it clearly showed a depression of Tc much larger than proximity effect, non monotonic behavior in Bc2(0) and dBc 2/dT c behavior with Nb layer thickness.
650		0	_94642 _aHumanities and Applied Sciences
700			_918431 _aBaskaran, R.
773	0		_dNew Delhi CSIR-NISCAIR _tIndian journal of pure & applied physics (IJPAP) _x0019-5596
856			_uhttp://nopr.niscpr.res.in/bitstream/123456789/59499/1/IJPAP%2060%283%29%20198-203.pdf _yClick here
942			_2ddc _cAR