000 00504nam a2200181Ia 4500
999 _c4463
_d4463
005 20181011094312.0
008 180926s9999 xx 000 0 und d
020 _a0-19-806415-2
040 _aAIKTC-KRRC
_cAIKTC-KRRC
041 _aENG
082 _a621.38150287
_bBUR/ROB
_2DDC23
100 _aBurns, Mark
245 0 _aIntroduction to Mixed Signal IC Test & Measurement
250 _a1st
260 _aNew Delhi
_bOxford University Press
_c2009
300 _a684 p.
_bPaperback
_c24*17.5
650 _aEXTC Engineering
700 _aRoberts, Gordon W.
942 _cBK
_2ddc