Fundamentals of Electromigration-Aware Integrated Circuit Design (Record no. 13201)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 05774nam a22005415i 4500 |
| 001 - CONTROL NUMBER | |
| control field | 978-3-319-73558-0 |
| 003 - CONTROL NUMBER IDENTIFIER | |
| control field | DE-He213 |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20211216140938.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 180223s2018 gw | s |||| 0|eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9783319735580 |
| 040 ## - CATALOGING SOURCE | |
| Transcribing agency | AIKTC-KRRC |
| 041 ## - LANGUAGE CODE | |
| Language code of text/sound track or separate title | ENG |
| 072 #7 - SUBJECT CATEGORY CODE | |
| Subject category code | TJFC |
| Source | bicssc |
| 072 #7 - SUBJECT CATEGORY CODE | |
| Subject category code | TEC008010 |
| Source | bisacsh |
| 072 #7 - SUBJECT CATEGORY CODE | |
| Subject category code | TJFC |
| Source | thema |
| 082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.3815 |
| Edition number | 23 |
| 100 1# - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Lienig, Jens. |
| Relator term | author. |
| Relator code | aut |
| -- | http://id.loc.gov/vocabulary/relators/aut |
| 245 10 - TITLE STATEMENT | |
| Title | Fundamentals of Electromigration-Aware Integrated Circuit Design |
| Medium | [electronic resource] / |
| 250 ## - EDITION STATEMENT | |
| Edition statement | 1st ed. 2018. |
| 264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE | |
| Place of production, publication, distribution, manufacture | Cham : |
| Name of producer, publisher, distributor, manufacturer | Springer International Publishing : |
| -- | Imprint: Springer, |
| Date of production, publication, distribution, manufacture, or copyright notice | 2018. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | XIII, 159 p. 99 illus., 95 illus. in color. |
| Other physical details | | Binding - Card Paper | |
| 336 ## - CONTENT TYPE | |
| Content type term | text |
| Content type code | txt |
| Source | rdacontent |
| 337 ## - MEDIA TYPE | |
| Media type term | computer |
| Media type code | c |
| Source | rdamedia |
| 338 ## - CARRIER TYPE | |
| Carrier type term | online resource |
| Carrier type code | cr |
| Source | rdacarrier |
| 347 ## - DIGITAL FILE CHARACTERISTICS | |
| File type | text file |
| Encoding format | |
| Source | rda |
| 520 ## - SUMMARY, ETC. | |
| Summary, etc. | The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. It introduces the physical process of electromigration, which gives the reader the requisite understanding and knowledge for adopting appropriate counter measures. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration. Finally, the authors show how specific effects can be exploited in present and future technologies to reduce electromigration’s negative impact on circuit reliability. Enables readers to understand and meet challenges of electromigration, including its effects on the reliability of electronic systems Accessible to readers of varying backgrounds and experience levels, combining practical application with theoretical underpinnings. Extensive use of multi-color illustrations, for rapid and clear understanding Multiple examples and hands-on instructions for the practical application of counter measures. “This unique book provides the fundamental science necessary for a sound grounding from which to make practical use of the complete and indispensable application-oriented information regarding the electromigration-aware design of electronic systems. It is a foundational reference for today’s design professionals, as well as for the next generation of engineering students.” Prof. Worthy Martin, University of Virginia “This is a long-awaited book bridging the design and reliability methodologies imperative for generating robust and high-performing semiconductor devices. A deep insight into physics of the electromigration induced degradation of on-chip interconnect components as well as explaining a design specific failure development are beneficial for both the chip-design and materials engineering communities.” Dr. Valeriy Sukharev, D2S Calibre Division of Mentor, a Siemens Business “As digital electronic circuits scale down, it is getting increasingly difficult to maintain digital abstractions against a variety of physical phenomena, such as electromigration. This book summarizes our current understanding of electromigration and how its effects can be moderated in practice. Particularly important and valuable are techniques that can address electromigration in modern automated design flows.” Prof. Igor Markov, University of Michigan “This timely book builds a fundamental knowledge of electromigration as well as discussing methods for designing robust integrated circuits. It covers electromigration, methodologies for electromigration-aware design for analog and digital circuits, and methods for mitigating electromigration during the physical design, all in-depth. Rarely, one can find a book with such scope and such practical applications. This book is an excellent resource for new and experienced IC designers.” Prof. Laleh Behjat, University of Calgary “Good to have this book that walks the readers through a wonderful journey from understanding the basics and background of electromigration in circuit reliability to its physical process and the counter measures in physical design. It can help greatly people in different disciplines to understand these important topics and work towards better solutions in future technologies.” Prof. Evangeline F.Y. Young, The Chinese University of Hong Kong. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | EXTC Engineering |
| 9 (RLIN) | 4619 |
| 653 ## - INDEX TERM--UNCONTROLLED | |
| Uncontrolled term | Electronic Circuits and Devices. |
| 653 ## - INDEX TERM--UNCONTROLLED | |
| Uncontrolled term | Processor Architectures. |
| 653 ## - INDEX TERM--UNCONTROLLED | |
| Uncontrolled term | Electronics and Microelectronics, Instrumentation. |
| 700 1# - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Thiele, Matthias. |
| Relator term | author. |
| Relator code | aut |
| -- | http://id.loc.gov/vocabulary/relators/aut |
| 710 2# - ADDED ENTRY--CORPORATE NAME | |
| Corporate name or jurisdiction name as entry element | SpringerLink (Online service) |
| 773 0# - HOST ITEM ENTRY | |
| Title | Springer Nature eBook |
| 776 08 - ADDITIONAL PHYSICAL FORM ENTRY | |
| Relationship information | Printed edition: |
| International Standard Book Number | 9783319735573 |
| 776 08 - ADDITIONAL PHYSICAL FORM ENTRY | |
| Relationship information | Printed edition: |
| International Standard Book Number | 9783319735597 |
| 776 08 - ADDITIONAL PHYSICAL FORM ENTRY | |
| Relationship information | Printed edition: |
| International Standard Book Number | 9783030088118 |
| 856 40 - ELECTRONIC LOCATION AND ACCESS | |
| Uniform Resource Identifier | <a href="https://doi.org/10.1007/978-3-319-73558-0">https://doi.org/10.1007/978-3-319-73558-0</a> |
| Public note | Click here to access eBook in Springer Nature platform. (Within Campus only.) |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | eBooks |
| Source of classification or shelving scheme | Dewey Decimal Classification |
No items available.