Study of an n-MOSFET by designing at 100 nm and simulating using SILVACO ATLAS simulator (Record no. 18117)

MARC details
000 -LEADER
fixed length control field a
003 - CONTROL NUMBER IDENTIFIER
control field OSt
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20221107101402.0
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fixed length control field 221107b xxu||||| |||| 00| 0 eng d
040 ## - CATALOGING SOURCE
Original cataloging agency AIKTC-KRRC
Transcribing agency AIKTC-KRRC
100 ## - MAIN ENTRY--PERSONAL NAME
9 (RLIN) 18921
Author Bhuyan, Muhibul Haque
245 ## - TITLE STATEMENT
Title Study of an n-MOSFET by designing at 100 nm and simulating using SILVACO ATLAS simulator
250 ## - EDITION STATEMENT
Volume, Issue number Vol.12(1), Jan-Feb
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. Haryana
Name of publisher, distributor, etc. IOSR - International Organization of Scientific Research
Year 2022
300 ## - PHYSICAL DESCRIPTION
Pagination 7-15p.
520 ## - SUMMARY, ETC.
Summary, etc. In this paper, the design steps of an n-MOSFET have been described and then the electrical characterization of<br/>this MOSFET is simulated at 100 nm by using the SILVACO ATLAS software, which is a process and device<br/>simulation software tool. The MOS device is virtually fabricated using ATHENA in SILVACO and simulations<br/>have been performed with help of ATLAS software, and all graphs are plotted using TONYPLOT in the<br/>SILVACO. The simulated results are then analyzed to study the n-MOSFET device’s mesh structure, transfer<br/>and output characteristics of the same, doping and carrier concentration plot, etc. From the simulation study,<br/>we found that the designed device is working well for various bias conditions.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
9 (RLIN) 4619
Topical term or geographic name entry element EXTC Engineering
700 ## - ADDED ENTRY--PERSONAL NAME
9 (RLIN) 18922
Co-Author Md. Tariqul Islam
773 0# - HOST ITEM ENTRY
Place, publisher, and date of publication Gurgaon International Organization Of Scientific Research (IOSR)
Title IOSR journal of VLSI and signal processing (IOSR-JVSP)
International Standard Serial Number 2319 – 4197
856 ## - ELECTRONIC LOCATION AND ACCESS
URL https://www.iosrjournals.org/iosr-jvlsi/papers/vol12-issue1/Ser-1/B12010715.pdf
Link text Click here
942 ## - ADDED ENTRY ELEMENTS (KOHA)
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Koha item type Articles Abstract Database
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    Dewey Decimal Classification     School of Engineering & Technology School of Engineering & Technology Archieval Section 07/11/2022   2022-2022 07/11/2022 07/11/2022 Articles Abstract Database
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