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Efficient analysis of defects using naive bayes classification and impact on effort and cost of the project
Publication details: Delhi Research India Publication 2018Edition: Vol. 11(2), July-DecemberDescription: 91-99Subject(s): In: Advances in wireless and mobile communications (AWMC)Summary: Research work focuses on impact of defects identified in various stages of software development life cycle (SDLC) on overall project effort and cost. Naive bayes classification technique is used to identify the bug tracking...............| Item type | Current library | Status | Barcode | |
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School of Engineering & Technology Archieval Section | Not for loan | 2018125 |
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Research work focuses on impact of defects identified in various stages of software development life cycle (SDLC) on overall project effort and cost. Naive bayes classification technique is used to identify the bug tracking...............
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