000 03368nam a22005055i 4500
999 _c11723
_d11723
001 978-3-319-48899-8
003 DE-He213
005 20211208091946.0
008 161130s2017 gw | s |||| 0|eng d
020 _a9783319488998
040 _cAIKTC-KRRC
041 _aENG
072 7 _aTJFC
_2bicssc
072 7 _aTEC008010
_2bisacsh
072 7 _aTJFC
_2thema
082 0 4 _a621.3815
_223
100 1 _aPosser, Gracieli.
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
245 1 0 _aElectromigration Inside Logic Cells
_h[electronic resource] :
_bModeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS /
250 _a1st ed. 2017.
264 1 _aCham :
_bSpringer International Publishing :
_bImprint: Springer,
_c2017.
300 _aXX, 118 p. 72 illus., 69 illus. in color.
_bCard Paper
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
520 _aThis book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power. The authors are the first to analyze and propose a solution for the electromigration effects inside logic cells of a circuit. They show in this book that an interconnect inside a cell can fail reducing considerably the circuit lifetime and they demonstrate a methodology to optimize the lifetime of circuits, by placing the output, Vdd and Vss pin of the cells in the less critical regions, where the electromigration effects are reduced. Readers will be enabled to apply this methodology only for the critical cells in the circuit, avoiding impact in the circuit delay, area and performance, thus increasing the lifetime of the circuit without loss in other characteristics. .
650 0 _aEXTC Engineering
_94619
653 _aElectronic Circuits and Devices.
653 _aProcessor Architectures.
700 1 _aSapatnekar, Sachin S.
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
700 1 _aReis, Ricardo.
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
710 2 _aSpringerLink (Online service)
773 0 _tSpringer Nature eBook
776 0 8 _iPrinted edition:
_z9783319488981
776 0 8 _iPrinted edition:
_z9783319489001
776 0 8 _iPrinted edition:
_z9783319840413
856 4 0 _uhttps://doi.org/10.1007/978-3-319-48899-8
_zClick here to access eBook in Springer Nature platform. (Within Campus only.)
942 _cEBOOKS
_2ddc