000 -LEADER |
fixed length control field |
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003 - CONTROL NUMBER IDENTIFIER |
control field |
OSt |
005 - DATE AND TIME OF LATEST TRANSACTION |
control field |
20191216102852.0 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
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191216b xxu||||| |||| 00| 0 eng d |
040 ## - CATALOGING SOURCE |
Original cataloging agency |
AIKTC-KRRC |
Transcribing agency |
AIKTC-KRRC |
100 ## - MAIN ENTRY--PERSONAL NAME |
9 (RLIN) |
11192 |
Author |
Puranik, Vishal Gangadhar |
245 ## - TITLE STATEMENT |
Title |
Fault Detection Attainment for Embedded Cores based on Software Test Routines |
250 ## - EDITION STATEMENT |
Volume, Issue number |
Vol.8(1), Jan-Apr |
260 ## - PUBLICATION, DISTRIBUTION, ETC. |
Place of publication, distribution, etc. |
New Delhi |
Name of publisher, distributor, etc. |
STM Journals |
Year |
2018 |
300 ## - PHYSICAL DESCRIPTION |
Pagination |
1-6p. |
520 ## - SUMMARY, ETC. |
Summary, etc. |
The test circuitry is designed in built-in-self-test (BIST) technique involves a system that applies the test signals and observes the corresponding system response. In this technique, the framework is embedded directly into the system hardware. The testing process performs efficiently, fastly and more economically than using an external test setup. Self-testing of embedded processors based on the test routines is an emerging method, since it employs a test resource partitioning technique instead of using external testers. In this paper, an improved methodology for embedded cores based on comprehension of their instruction set and register transfer (RT) level description is explained. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
9 (RLIN) |
4619 |
Topical term or geographic name entry element |
EXTC Engineering |
700 ## - ADDED ENTRY--PERSONAL NAME |
9 (RLIN) |
11193 |
Co-Author |
Shah, Dilip Devchand |
773 0# - HOST ITEM ENTRY |
Title |
Journal of VLSI design tools & technology (JoVDTT) |
Place, publisher, and date of publication |
Noida STM Journals |
International Standard Serial Number |
2321–6492 |
856 ## - ELECTRONIC LOCATION AND ACCESS |
URL |
http://engineeringjournals.stmjournals.in/index.php/JoVDTT/article/view/356 |
Link text |
Click here |
942 ## - ADDED ENTRY ELEMENTS (KOHA) |
Source of classification or shelving scheme |
|
Koha item type |
Articles Abstract Database |